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TA.L8: Integrative Applications: Industrial

Session Type: Lecture
Time: Tuesday, September 27, 10:30 - 12:30
Location: Room 105 C
Session Chair: Moncef Gabbouj, Tampere University of Technology
 
Presented 10:30 - 10:50
  TA.L8.1: HIGH QUALITY TRADEMARK PROPOSALS BASED ON TRADEMARK-CONFIDENCE SCORE OF MSERS
         Yuan Zhang; Samsung Electronics
         Wei Wen; Samsung Electronics
         Lei Nie; Samsung Electronics
         Junjun Xiong; Samsung Electronics
         Yehui Yang; Chinese Academy of Sciences
 
Presented 10:50 - 11:10
   TA.L8.2: A MORPHOLOGICAL APPROACH TO THE AUTOMATIC DETECTION OF DARK FRINGES APPLIED TO BIREFRINGENCE IMAGES
         Lucas Thomaz; Universidade Federal do Rio de Janeiro
         Allan da Silva; Universidade Federal do Rio de Janeiro
         Eduardo da Silva; Universidade Federal do Rio de Janeiro
         Sergio Netto; Universidade Federal do Rio de Janeiro
         Andre Castro; Universidade Federal do Rio de Janeiro
         Juliana Pereira; Universidade Federal do Rio de Janeiro
         Argimiro Secchi; Universidade Federal do Rio de Janeiro
 
Presented 11:10 - 11:30
   TA.L8.3: ROBUST REAL-TIME UAV BASED POWER LINE DETECTION AND TRACKING
         Guang Zhou; University of Texas at Dallas
         Jinwei Yuan; University of Texas at Dallas
         I-Ling Yen; University of Texas at Dallas
         Farokh Bastani; University of Texas at Dallas
 
Presented 11:30 - 11:50
   TA.L8.4: IS OVERFEAT USEFUL FOR IMAGE-BASED SURFACE DEFECT CLASSIFICATION TASKS?
         Pei-Hung Chen; Nanyang Technological University
         Shen-Shyang Ho; Nanyang Technological University
 
Presented 11:50 - 12:10
  TA.L8.5: MULTI-FEATURE SPARSE-BASED DEFECT DETECTION AND CLASSIFICATION IN SEMICONDUCTOR UNITS
         Bashar Haddad; Arizona State University
         Lina J. Karam; Arizona State University
         Jieping Ye; Arizona State University
         Nital Patel; Intel Corporation
         Martin Braun; Intel Corporation
 
Presented 12:10 - 12:30
   TA.L8.6: ANOMALY REGION DETECTION AND LOCALIZATION IN METAL SURFACE INSPECTION
         Sriram Vaikundam; Rolls Royce @ NTU corporate lab
         Tzu-Yi Hung; Rolls Royce @ NTU corporate lab
         Liang Tien Chia; Nanyang Technological University